Doctoral School on Advanced Atomic Scale Characterisation at Chalmers
















The IDEA League Doctoral School on Advanced Atomic Scale Characterisation at Chalmers University of Technology was held on May 13-17, 2019. The program included lectures and practical hands-on sessions on state-of-the-art electron microscopes. The topics included high precision scanning transmission electron microscopy (STEM), TEM tomography for 3D studies of materials, focused ion beam combined with scanning electron microscopy (FIB-SEM) tomography, image processing, in situ SEM and TEM, electron holography, energy dispersive x-ray analysis (EDX), monochromated electron energy loss spectroscopy (EELS) and differential phase contrast (DPC) STEM. An important part of the IDEAL League schools on microscopy is the interaction and networking among the school participants and also with the lecturers and assistants. Our Chalmers school involved colleagues from Chalmers, RISE (Research Institutes of Sweden), Arizona State University, Max-Planck-Institute für Kohlenforschung in Mülheim, Stanford University, RWTH Aachen University, University of Tokyo, Oxford University, Ernst Ruska-Centre Forschungszentrum Jülich, Christian Albrechts University Kiel, JEOL Japan, CEOS GmbH and Gatan USA.

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